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--- |
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license: mit |
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datasets: |
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- bug-localization/BeetleBox |
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- princeton-nlp/SWE-bench |
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language: |
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- en |
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base_model: |
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- codesage/codesage-base |
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tags: |
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- bug |
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- localization |
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- embedding |
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- multi-language |
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--- |
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# π₯ BLAZE: Cross-Language and Cross-Project Bug Localization |
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**BLAZE** is a transformer-based bug localization model that works across languages and software projects. It enhances source-bug alignment using **dynamic chunking** and **hard example learning**, enabling precise bug localization in unseen codebases and programming languages. |
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[](https://doi.org/10.1109/TSE.2025.3579574) |
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[](https://zenodo.org/records/15122980) |
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--- |
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## β¨ Highlights |
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* π **Cross-project & cross-language** bug localization with no re-training |
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* π **Dynamic Chunking** handles long files within LLM context windows |
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* π§ **Hard Example Learning** improves generalization and ranking accuracy |
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* π Supports Java, Python, C++, JavaScript, and Go |
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* π Outperforms both cross-project and embedding-based baselines |
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--- |
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## π Dataset: BeetleBox |
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**BeetleBox** is the largest curated dataset for bug localization: |
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* 23,782 real-world bugs |
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* 29 repositories |
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* 5 programming languages |
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* Cleaned and de-duplicated to remove overlaps with training data |
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π₯ [Available on Zenodo](https://zenodo.org/records/15122980) |
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π Also listed on Hugging Face Datasets: `bug-localization/BeetleBox` |
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--- |
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## π Demo & Usage |
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All code, usage instructions, model files, and scripts are available via: |
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π **[BLAZE Repository & Demo (Zenodo)](https://zenodo.org/records/15122980)** |
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--- |
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## π Citation |
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Please cite the following paper if you use BLAZE or BeetleBox in your work: |
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```bibtex |
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@article{Chakraborty2025, |
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title = {BLAZE: Cross-Language and Cross-Project Bug Localization via Dynamic Chunking and Hard Example Learning}, |
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ISSN = {2326-3881}, |
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url = {http://dx.doi.org/10.1109/TSE.2025.3579574}, |
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DOI = {10.1109/TSE.2025.3579574}, |
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journal = {IEEE Transactions on Software Engineering}, |
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publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, |
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author = {Chakraborty, Partha and Alfadel, Mahmoud and Nagappan, Meiyappan}, |
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year = {2025}, |
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pages = {1--14} |
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} |
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``` |