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25.945
8.3.8.1.4.2 Procedure
Common with 3.84 Mcps Chip rate TDD option
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25.945
8.3.8.1.5 Test requirements
Common with 3.84 Mcps TDD option.
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8.3.8.1.6 Explanation difference
For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, so the number of timeslot i should be 0, 1,…,6. The structure of subframe is shown in section 7.2.1 of TR 25.928.
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8.3.8.2 Peak code domain error
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25.945
8.3.8.2.1 Definition and applicability
Common with 3.84 Mcps TDD option.
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25.945
8.3.8.2.2 Conformance requirements
Common with 3.84 Mcps TDD option.
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25.945
8.3.8.2.3 Test purpose
Common with 3.84 Mcps TDD option.
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8.3.8.2.4 Method of test
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8.3.8.2.4.1 Initial conditions
1) Common with the 3.84 Mcps chip rate 2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table. Table 8.14: Parameters of the transmitted signal for Peak code domain error for 1.28 Mcps chip rate TDD option Parameter Value/description TDD Duty Cycle TS i; i = 0, 1, 2, ..., 6: transmit, if i is 0,4,5,6; receive, if i is 1,2,3. BS output power setting PRAT Number of DPCH in each active TS 8 Power of each DPCH 1/8 of Base Station output power Data content of DPCH real life (sufficient irregular) Spreading factor 16
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8.3.8.2.4.2 Procedure
Common with 3.84 Mcps Chip rate TDD option
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25.945
8.3.8.2.5 Test requirements
Common with 3.84 Mcps TDD option.
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8.3.8.2.6 Explanation difference
For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8.
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8.4 Receiver characteristics
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8.4.1 General
Common with 3.84 Mcps TDD option.
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8.4.2 Reference sensitivity level
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8.4.2.1 Definition and applicability
Common with 3.84 Mcps TDD option.
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8.4.2.2 Conformance requirements
For the measurement channel specified in Annex 8.A.2.1, the reference sensitivity level and performance of the BS shall be as specified in table section 6.3.2.1 of TR 25.945.
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8.4.2.3 Test purpose
Common with 3.84 Mcps TDD option.
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8.4.2.4 Method of test
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8.4.2.4.1 Initial conditions
1) Common with the 3.84 Mcps chip rate 2) Common with the 3.84 Mcps chip rate 3) Common with the 3.84 Mcps chip rate. 4) The level of BS tester output signal measured at the BS antenna connector shall be adjusted to -110 dBm.
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8.4.2.4.2 Procedure
Common with 3.84 Mcps chip rate TDD option.
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25.945
8.4.2.5 Test requirements
Common with 3.84 Mcps TDD option.
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8.4.2.6 Explanation difference
There is no difference in the test method and test procedure between high chip rate TDD and low chip rate TDD, however the requirement is changed according to section 6.3.2.1 of TR 25.945.
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8.4.3 Dynamic range
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8.4.3.1 Definition and applicability
Common with 3.84 Mcps TDD option.
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8.4.3.2 Conformance requirements
The BER shall not exceed 0,001 for the parameters specified in table in section 6.3.3 of TR 25.945.
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8.4.3.3 Test purpose
Common with 3.84 Mcps TDD option.
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8.4.3.4 Method of test
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8.4.3.4.1 Initial conditions
1) Common with the 3.84 Mcps chip rate 2) The level of the BS tester output signal measured at the BS antenna connector shall be adjusted as specified in table in subclause 8.4.3.2 3) The power spectral density of the band-limited white noise source measured at the BS antenna connector shall be adjusted as specified in table in subclause 8.4.3.2. The minimum bandwidth of the white noise source shall be 1,5 times the chip rate (1,92 MHz for a chip rate of 1.28 Mcps).
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8.4.3.4.2 Procedure
Common with 3.84 Mcps chip rate TDD option.
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25.945
8.4.3.5 Test requirement
Common with 3.84 Mcps TDD option.
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8.4.3.6 Explanation difference
Due to the smaller bandwidth in low chip rate TDD the bandwidth of the white noise source is changed.
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8.4.4 Adjacent Channel Selectivity (ACS)
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8.4.4.1 Definition and applicability
Common with 3.84 Mcps TDD option.
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8.4.4.2 Conformance requirements
The BER, measured on the wanted signal in the presence of an interfering signal, shall not exceed 0,001 for the parameters specified in table in section 6.3.4 of TR 25.945.
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8.4.4.3 Test purpose
Common with 3.84 Mcps TDD option.
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8.4.4.4 Method of test
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8.4.4.4.1 Initial conditions
Common with the 3.84 Mcps chip rate Common with the 3.84 Mcps chip rate Start transmission from the BS tester to the BS using the UL reference measurement channel (12.2 kbps) defined in Annex C.3.The level of the UE simulator signal measured at the BS antenna connector shall be adjusted to the value specified in table in subclause 8.4.4.2 Set the signal generator to produce an interfering signal that is equivalent to a continuous narrow band CDMA signal with one code of chip frequency 1.28 Mchip/s, filtered by an RRC transmit pulse-shaping filter with roll-off  = 0,22 and 1.6MHz bandwidth. The level of the interfering signal measured at the BS antenna connector shall be adjusted to the value specified in table in subclause 8.4.4.2
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8.4.4.4.2 Procedure
1) Set the center frequency of the interfering signal to 1,6 MHz above the assigned channel frequency of the wanted signal. 2) Measure the BER of the wanted signal at the BS receiver. 3) Set the center frequency of the interfering signal to 1,6 MHz below the assigned channel frequency of the wanted signal. 4) Measure the BER of the wanted signal at the BS receiver. 5) Interchange the connections of the BS Rx ports and repeat the measurements according to steps (1) to (4).
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8.4.4.5 Test requirements
The BER measured according subclause 8.4.4.4.2 to shall not exceed 0,001.
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8.4.4.6 Explanation difference
Because bandwidth of 1.28 Mcps TDD option is 1,6MHz, the frequency offset of the interfering singal should be 1,6MHz.
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8.4.5 Blocking characteristics
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8.4.5.1 Definition and applicability
The blocking characteristics is a measure of the receiver ability to receive a wanted signal at its assigned channel frequency in the presence of an unwanted interferer on frequencies other than those of the adjacent channels. The blocking performance shall apply at all frequencies as specified in tables in section 6.3.2 of TR 25.945 respectively, using a 1 MHz step size. The requirements in this subclause shall apply to base stations intended for general-purpose applications.
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8.4.5.2 Conformance requirements
The static reference performance as specified in the section 6.3.2 of TR 25.945 should be met with a wanted and an interfering signal coupled to the BS antenna input using the parameters specified in tables in section 6.3.5 of TR 25.945 respectively, using a 1 MHz step size..
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8.4.5.3 Test purpose
The test stresses the ability of the BS receiver to withstand high-level interference from unwanted signals at frequency offsets of 3.2 MHz or more, without undue degradation of its sensitivity.
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8.4.5.4 Method of test
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8.4.5.4.1 Initial conditions
1) Connect an UE simulator operating at the assigned channel frequency of the wanted signal and a signal generator to the antenna connector of one Rx port. 2) Terminate or disable any other Rx port not under test. 3) Start transmission from the BS tester to the BS using the UL reference measurement channel (12.2 kbps) defined in Annex C.3.The level of the UE simulator signal measured at the BS antenna connector shall be set to 6 dB above the reference sensitivity level specified section 6.3.2.
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8.4.5.4.2 Procedure
1) Set the signal generator to produce an interfering signal at a frequency offset Fuw from the assigned channel frequency of the wanted signal which is given by Fuw =  (n x 1 MHz), where n shall be increased in integer steps from n = 10 up to such a value that the center frequency of the interfering signal covers the range from 1 MHz to 12,75 GHz. The interfering signal level measured at the antenna connector shall be set in dependency of its center frequency, as specified in tables in section 6.3.5 of TR 25.945. respectively. The type of the interfering signal is either equivalent to a continuous narrow band CDMA signal with one code of chip frequency 1.28 Mchip/s, filtered by an RRC transmit pulse-shaping filter with roll-off  = 0,22, or a CW signal; see tables in section 6.3.5 of TR 25.945 respectively. 2) Common with 3.84 Mcps chip rate TDD option.
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8.4.5.5 Test requirements
In all measurements made according to subclause 8.4.5.4.2, the BER shall not exceed 0,001.
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8.4.5.6 Explanation difference
Because the chip rate of the wanted signal is 1.28 Mcps, the type of the interfering signal is either equivalent to a continuous narrow band CDMA signal with one code of chip frequency 1.28 Mchip/s.
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8.4.6 Intermodulation characteristics
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8.4.6.1 Definition and applicability
Common with 3.84 Mcps TDD option.
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8.4.6.2 Conformance requirements
The static reference performance as specified in clause 8.4.2 of TR 25.945 should be met when the following signals are coupled to the BS antenna input. A wanted signal at the assigned channel frequency, 6 dB above the static reference level. Two interfering signals with the parameters specified in following table. Table 8.15: Parameters of the interfering signals for intermodulation characteristics testing of 1.28 Mcps TDD option Interfering Signal Level Offset Type of Interfering Signal - 48 dBm 3,2 MHz CW signal - 48 dBm 6,4 MHz NCDMA signal with one code The reference for this requirement is subclause 6.3.6.
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8.4.6.3 Test purpose
Common with 3.84 Mcps TDD option.
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8.4.6.4 Method of test
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8.4.6.4.1 Initial conditions
1) Common with 3.84 Mcps chip rate TDD option. 2) Common with 3.84 Mcps chip rate TDD option. 3) Start transmission from the BS tester to the BS using the UL reference measurement channel (12.2 kbps) defined in Annex 8.A.2 of TR 25.945 The level of the UE simulator signal measured at the BS antenna connector shall be set to 6 dB above the reference sensitivity level specified section 6.3.2 of TR 25.945. 4) Set the first signal generator to produce a CW signal with a level measured at the BS antenna connector of - 48 dBm. 5) Set the second signal generator to produce an interfering signal equivalent to a narrow band CDMA signal with one code of chip frequency 1.28 Mchip/s, filtered by an RRC transmit pulse-shaping filter with roll-off  = 0,22. The level of the signal measured at the BS antenna connector shall be set to - 48 dBm.
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8.4.6.4.2 Procedure
1) The frequency of the first and the second signal generator shall be set to 3,2 MHz and 6,4 MHz, respectively, above the assigned channel frequency of the wanted signal. 2) Measure the BER of the wanted signal at the BS receiver. 3) The frequency of the first and the second signal generator shall be set to 3,2 MHz and 6,4 MHz, respectively, below the assigned channel frequency of the wanted signal. 4) Measure the BER of the wanted signal at the BS receiver. 5) Interchange the connections of the BS Rx ports and repeat the measurements according to steps (1) to (4).
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8.4.6.5 Test requirements
The BER measured according subclause 8.4.6.4.2 to shall not exceed 0,001.
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8.4.6.6 Explanation difference
Because the bandwidth of 1.28 Mcps TDD is 1,6MHz, the frequency offsets of first and second interference signal should be 3,2MHz and 6,4MHz respectively.
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8.4.7 Spurious emissions
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8.4.7.1 Definition and applicability
Common with 3.84 Mcps TDD option.
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8.4.7.2 Conformance requirements
The power of any spurious emission shall not exceed the values given in table in section 6.3.7 of TR 25.945
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8.4.7.3 Test requirements
Common with 3.84 Mcps TDD option.
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8.4.7.4 Method of test
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8.4.7.4.1 Initial conditions
1) Common with the 3.84 Mcps chip rate 2) Common with the 3.84 Mcps chip rate 3) Common with the 3.84 Mcps chip rate 4) Set the BS to transmit a signal with parameters according to following table. 5) Common with the 3.84 Mcps chip rate Table 8.16: Parameters of the transmitted signal for Rx spurious emissions test Parameter Value/description TDD Duty Cycle TS i; i = 0, 1, 2, ..., 6: transmit, if i is 0,4,5,6; receive, if i is 1,2,3. BS output power setting PRAT Number of DPCH in each active TS 8 Power of each DPCH 1/8 of Base Station output power Data content of DPCH real life (sufficient irregular)
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8.4.7.4.2 Procedure
1) Measure the power of the spurious emissions by applying the measuring equipment with the settings as specified in following table. The characteristics of the measurement filter with the bandwidth 1.28 MHz shall be RRC with roll-off  = 0,22. The characteristics of the measurement filters with bandwidths 100 kHz and 1 MHz shall be approximately Gaussian (typical spectrum analyzer filter). The center frequency of the filters shall be stepped in contiguous steps over the frequency bands as specified in following table. The time duration of each step shall be sufficiently long to capture one transmit time slot. 2) If the BS is equipped with more than one Rx port, interchange the connections of the BS Rx ports and repeat the measurement according to (1). Table 8.17: Measurement equipment settings Stepped frequency range Measurement bandwidth Step width Note Detection mode 9 kHz – 1 GHz 100 kHz 100 kHz true RMS 1 GHz – 1,900 GHz 1 MHz 1 MHz With the exception of frequencies between 4 MHz below the first carrier frequency and 4 MHz above the last carrier frequency used by the BS 1,900 GHz – 1,980 GHz 1.28 MHz 200 kHz 1,980 GHz – 2,010 GHz 1 MHz 1 MHz 2,010 GHz – 2,025 GHz 1.28 MHz 200 kHz 2,025 GHz – 12,75 GHz 1 MHz 1 MHz
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8.4.7.5 Test requirements
The spurious emissions measured according to subclause 8.4.7.4.2 shall not exceed the limits specified in subclause 8.4.7.2.
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8.4.7.6 Explanation difference
For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel for 144kbits/s need two timeslots, each consists of 8 DPCH(SF=16).So the number of DPCH in each active TS should be 8. Due to the smaller bandwidth in low chip rate TDD the measurement bandwidth is changed.
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8.5 Performance requirements
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8.5.1 General
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8.5.2 Demodulation in static propagation conditions
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8.5.2.1 Demodulation of DCH
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8.5.2.1.1 Definition and applicability
Common with 3.84 Mcps TDD.
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8.5.2.1.2 Conformance requirements
For the parameters specified in table 8.18, the BLER should not exceed the piece-wise linear BLER curve specified in table 8.19. Table 8.18: Parameters in static propagation conditions for 1.28 Mcps TDD option Parameters Unit Test 1 Test 2 Test 3 Test 4 Number of DPCHo 4 1 1 0 Spread factor of DPCHo 8 8 8 dB -7 -7 -7 – Ioc dBm/1.28 MHz -91 Information Data Rate kbps 12,2 64 144 384 Table 8.19: Performance requirements in AWGN channel. Test Number [dB] BLER 1 0.6 10-2 2 -0.9 10-1 -0.4 10-2 3 -0.3 10-1 -0.1 10-2 4 0.5 10-1 0.6 10-2 The reference for this requirement is TR 25.945 subclause 6.4.2.
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8.5.2.1.3 Test purpose
Common with 3.84 Mcps TDD option.
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8.5.2.1.4 Method of test
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8.5.2.1.4.1 Initial conditions
Connect the BS tester (UE simulator) generating the wanted signal and a set of interference generators to both BS antenna connectors for diversity reception via a combining network. The set of interference generators comprises a number of CDMA generators, each representing an individual intracell interferer (subsequently called DPCH0 generators) that the DPCH0s are synchronous, and an additional band-limited white noise source, simulating interference from other cells. Each DPCH0 generator shall produce an interfering signal that is equivalent to a valid 1.28 Mcps TDD signal with spreading factor 8, using the same time slot(s) than the wanted signal and applying the same cell-specific scrambling code. The number of the DPCH0 generators used in each test is given in table 8.18.
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8.5.2.1.4.2 Procedure
1) Adjust the power of the band-limited white noise source in such a way that its power spectral density measured at the BS antenna connector takes on the value Ioc as specified in table 8.18. 2) For a given test defined by the information data rate and the BLER objective, set the power of each DPCH0 measured at the BS antenna connector during the active time slots to the value specified in table 8.20. 3) Set up a call between the BS tester generating the wanted signal and the BS. The characteristics of the call shall be configured according to the information data rate to be provided and the corresponding UL reference measurement channel defined in Annex 8.A. Depending on the information data rate, the UL reference measurement channel makes use of one or two Dedicated Physical Channels (DPCH1 and DPCH2) with different spreading factors SF. The power(s) of DPCH1 and DPCH2 (if applicable) measured at the BS antenna connector during the active time slots shall be set to the value(s) given in table 8.20. 4) Measure the BLER of the wanted signal at the BS receiver. Table 8.20: Parameters of DPCH0 and the wanted signal Test Number BLER objective Number of DPCH0 Power of each DPCH0 measured at the BS antenna connector [dBm] Parameters of the wanted signal DPCH SF Power measured at the BS antenna connector [dBm] 1 10-2 4 -97.4 DPCH1 8 -97.4 2 10-1 1 -98.9 DPCH1 2 -92.9 10-2 1 -98.4 DPCH1 2 -92.5 3 10-1 1 -98.3 DPCH1 2 -92.3 10-2 1 -98.1 DPCH1 2 -92.1 4 10-1 0 – DPCH1 8 -97.5 DPCH2 2 -91.5 10-2 0 – DPCH1 8 -97.4 DPCH2 2 -91.4
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8.5.2.1.5 Test requirements
The BLER measured according to subclause 8.5.2.1.4.2 shall not exceed the limits specified in table 8.19.
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8.5.2.1.6 Explanation difference
For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928). Considering the chip rate, the burst structure of 1.28 Mcps TDD for normal traffic is different from that of 3.84 Mcps TDD option, (the burst structure for normal traffic is shown in TR 25.928). So the propagation conditions, service mapping and simulation assumption of the measurement channel 12.2kps, 64pks, 144kps and 384kps should be different from those of 3.84 Mcps TDD option. As a result, the relevant parameters should be different.
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8.5.3 Demodulation of DCH in multipath fading conditions
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8.5.3.1 Multipath fading Case 1
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8.5.3.1.1 Definition and applicability
Common with 3.84 Mcps TDD option.
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8.5.3.1.2 Conformance requirements
For the parameters specified in table 8.21, the BLER should not exceed the piece-wise linear BLER curve specified in table 8.22. Table 8.21: Parameters multipath Case 1 channel for 1.28 Mcps TDD option Parameters Unit Test 1 Test 2 Test 3 Test 4 Number of DPCHo 4 1 1 0 Spread factor of DPCHo 8 8 8 dB -7 -7 -7 – Ioc dBm/1.28 MHz -91 Information Data Rate kbps 12,2 64 144 384 Table 8.22: Performance requirements multipath Case 1 channel Test Number [dB] BLER 1 10.4 10-2 2 5.3 10-1 9.4 10-2 3 5.7 10-1 10.1 10-2 4 6.0 10-1 10.0 10-2 The reference for this requirement is subclause 6.4.3.
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8.5.3.1.3 Test purpose
Common with 3.84 Mcps TDD option.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.1.4 Method of test
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.1.4.1 Initial conditions
1) Connect the BS tester (UE simulator) generating the wanted signal and a set of interference generators to both BS antenna connectors for diversity reception via a combining network. The set of interference generators comprises a number of CDMA generators, each representing an individual intracell interferer (subsequently called DPCH0 generators) that the DPCH0s are synchronous, and an additional band-limited white noise source, simulating interference from other cells. Each DPCH0 generator shall produce an interfering signal that is equivalent to a valid 1.28 Mcps TDD signal with spreading factor 8, using the same time slot(s) than the wanted signal and applying the same cell-specific scrambling code. The number of the DPCH0 generators used in each test is given in table 8.21. 2) The wanted signal produced by the BS tester and the interfering signals produced by the DPCH0 generators are individually passed through independent Multipath Fading Simulators (MFS) before entering the combining network. Each MFS shall be configured to simulate multipath fading Case 1.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.1.4.2 Procedure
1) Adjust the power of the band-limited white noise source in such a way that its power spectral density measured at the BS antenna connector takes on the value Ioc as specified in table 8.21. 2) For a given test defined by the information data rate and the BLER objective, set the power of each DPCH0 measured at the BS antenna connector during the active time slots to the value specified in table 8.21. 3) Set up a call between the BS tester generating the wanted signal and the BS. The characteristics of the call shall be configured according to the information data rate to be provided and the corresponding UL reference measurement channel defined in Annex C.3. Depending on the information data rate, the UL reference measurement channel makes use of one or two Dedicated Physical Channels (DPCH1 and DPCH2) with different spreading factors SF. The power(s) of DPCH1 and DPCH2 (if applicable) measured at the BS antenna connector during the active time slots shall be set to the value(s) given in table 8.23. 4) Measure the BLER of the wanted signal at the BS receiver. Table 8.23: Parameters of DPCH0 and the wanted signal Test Number BLER objective Number of DPCH0 Power of each DPCH0 measured at the BS antenna connector [dBm] Parameters of the wanted signal DPCH SF Power measured at the BS antenna connector [dBm] 1 10-2 4 -87.6 DPCH1 8 -87.6 2 10-1 1 -92.7 DPCH1 2 -86.7 10-2 1 -88.6 DPCH1 2 -82.6 3 10-1 1 -92.3 DPCH1 2 -86.3 10-2 1 -87.9 DPCH1 2 -81.9 4 10-1 0 – DPCH1 8 -92.0 DPCH2 2 -86.0 10-2 0 – DPCH1 8 -88.0 DPCH2 2 -82.0
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.1.5 Test requirements
The BLER measured according to subclause 8.5.3.1.4.2 shall not exceed the limits specified in table 8.22.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.1.6 Explanation difference
For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928). Considering the chip rate, the burst structure of 1.28 Mcps TDD for normal traffic is different from that of 3.84 Mcps TDD option, (the burst structure for normal traffic is shown in TR 25.928). So the propagation conditions, service mapping and simulation assumption of the measurement channel 12.2kps, 64pks, 144kps and 384kps should be different from those of 3.84 Mcps TDD option. As a result, the relevant parameters should be different.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2 Multipath fading Case 2
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2.1 Definition and applicabily
Common with 3.84 Mcps TDD option.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2.2 Conformance requirements
For the parameters specified in table 8.24, the BLER should not exceed the piece-wise linear BLER curve specified in table 8.25. Table 8.24: Parameters multipath Case 2 channel for 1.28 Mcps TDD option Parameters Unit Test 1 Test 2 Test 3 Test 4 Number of DPCHo 4 1 1 0 Spread factor of DPCHo 8 8 8 dB -7 -7 -7 – Ioc dBm/1.28 MHz -91 Information Data Rate kbps 12,2 64 144 384 Table 8.25: Performance requirements multipath Case 2 channel. Test Number [dB] BLER 1 6.7 10-2 2 3.6 10-1 5.9 10-2 3 4.2 10-1 6.3 10-2 4 4.6 10-1 6.0 10-2 The reference for this requirement is subclause 6.4.3.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2.3 Test purpose
Common with 3.84 Mcps TDD option.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2.4 Method of test
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2.4.1 Initial conditions
1) Connect the BS tester (UE simulator) generating the wanted signal and a set of interference generators to both BS antenna connectors for diversity reception via a combining network. The set of interference generators comprises a number of CDMA generators, each representing an individual intracell interferer (subsequently called DPCH0 generators) that the DPCH0s are synchronous, and an additional band-limited white noise source, simulating interference from other cells. Each DPCH0 generator shall produce an interfering signal that is equivalent to a valid 1.28 Mcps TDD signal with spreading factor 8, using the same time slot(s) than the wanted signal and applying the same cell-specific scrambling code. The number of the DPCH0 generators used in each test is given in table 8.24. 2) The wanted signal produced by the BS tester and the interfering signals produced by the DPCH0 generators are individually passed through independent Multipath Fading Simulators (MFS) before entering the combining network. Each MFS shall be configured to simulate multipath fading Case 2.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2.4.2 Procedure
1) Adjust the power of the band-limited white noise source in such a way that its power spectral density measured at the BS antenna connector takes on the value Ioc as specified in table 8.24. 2) For a given test defined by the information data rate and the BLER objective, set the power of each DPCH0 measured at the BS antenna connector during the active time slots to the value specified in table 8.26. 3) Set up a call between the BS tester generating the wanted signal and the BS. The characteristics of the call shall be configured according to the information data rate to be provided and the corresponding UL reference measurement channel defined in Annex C.3. Depending on the information data rate, the UL reference measurement channel makes use of one or two Dedicated Physical Channels (DPCH1 and DPCH2) with different spreading factors SF. The power(s) of DPCH1 and DPCH2 (if applicable) measured at the BS antenna connector during the active time slots shall be set to the value(s) given in table 8.26. 4) Measure the BLER of the wanted signal at the BS receiver. Table 8.26: Parameters of DPCH0 and the wanted signal Test Number BLER objective Number of DPCH0 Power of each DPCH0 measured at the BS antenna connector [dBm] Parameters of the wanted signal DPCH SF Power measured at the BS antenna connector [dBm] 1 10-2 4 -91.3 DPCH1 8 -91.3 2 10-1 1 -94.4 DPCH1 2 -88.4 10-2 1 -92.1 DPCH1 2 -86.1 3 10-1 1 -93.8 DPCH1 2 -87.8 10-2 1 -91.7 DPCH1 2 -85.7 4 10-1 0 – DPCH1 8 -93.4 DPCH2 2 -87.4 10-2 0 – DPCH1 8 -92.0 DPCH2 2 -86.0
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2.5 Test requirements
The BLER measured according to subclause 8.5.3.2.4.2 shall not exceed the limits specified in table 8.25.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.2.6 Explanation difference
For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928). Considering the chip rate, the burst structure of 1.28 Mcps TDD for normal traffic is different from that of 3.84 Mcps TDD option, (the burst structure for normal traffic is shown in TR 25.928). So the propagation conditions, service mapping and simulation assumption of the measurement channel 12.2kps, 64pks, 144kps and 384kps should be different from those of 3.84 Mcps TDD option. As a result, the relevant parameters should be different.
1cc4b09fd057c9a5cf925fb9b5a5f4e7
25.945
8.5.3.3 Multipath fading Case 3